Highly Accelerated Stress Test chamber DS-ST-35/DST-35
The inner tank adopts a double-layer arc design to prevent condensation and dripping during the test, thereby avoiding the product from being directly impacted by superheated steam during the test and affecting the test results;
Adopts a high-efficiency vacuum pump to make the inner tank reach the best pure saturated steam state;
Adopts a 7-inch true color touch screen with 99 groups of 4950 programs, USB curve data download function, RS-485 communication interface;
Adopts dry-wet bulb sensor for direct measurement (control mode is divided into 3 modes: dry-wet bulb, unsaturated, wet saturated, etc.).
$0.00
Description
DSST test chambers are suitable for IC packaging, semiconductors, microelectronic chips, magnetic materials and other electronic parts to conduct accelerated life reliability tests such as high pressure, high temperature and high humidity. They are suitable for the product design stage. They are used to quickly expose product defects and weak links and test the sealing and aging performance of the products.
